公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2017 | Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control | CHIH-I WU ; Lin, W.-H.; Brar, V.W.; Jariwala, D.; Sherrott, M.C.; Tseng, W.-S.; Wu, C.-I.; Yeh, N.-C.; Atwater, H.A.; CHIH-I WU | Chemistry of Materials |