公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2010 | The development of an automatic scanning path generation method for the spinneret test | Chen C.-J.; Hung M.-W.; Jywe W.; Chiang D.; Wen-Yuh Jywe | Proceedings of SPIE - The International Society for Optical Engineering | |||
2007 | Forward echelon-based inventory monitoring in semiconductor supply chain | Guo R.-S.; Chiang D.; Lin H.-W.; MING-HUANG CHIANG ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 0 | 0 | |
2006 | Supply chain inventory control in semiconductor manufacturing | Guo R.-S.; Chiang D.; MING-HUANG CHIANG ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 1 | 0 |