公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2007 | Determination of three-dimensional interfacial strain - A novel method of probing interface structure with X-ray Bragg-surface diffraction | Sun, W.-C.; Chu, C.-H.; Chang, H.-C.; Wu, B.-K.; Chen, Y.-R.; Cheng, C.-W.; Chiu, M.-S.; Shen, Y.-C.; Wu, H.-H.; Hung, Y.-S.; Chang, S.-L.; MINGHWEI HONG ; Tang, M.-T.; Stetsko, Yu.P. | Thin Solid Films |