Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2020 | Structural evolution of in situ boron-doped SiGe ultrathin film analyzed by multi-optical methods | Chang, F.-M.; Wu, Z.-Z.; Chen, Y.; Yen, T.-Y.; Huang, Y.-H.; Chong, L.-Y.; Jangjian, S.-K.; Lee, F.-Y.; Chang, Y.-M. ; Lo, K.-Y. | Nanotechnology | 1 | 1 |