公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2018 | Investigation of HfO2 thin films on Si by X-ray photoelectron spectroscopy, rutherford backscattering, grazing incidence X-ray diffraction and Variable Angle Spectroscopic Ellipsometry | Luo, X.; Li, Y.; Yang, H.; Liang, Y.; He, K.; Sun, W.; Yao, S.; Lu, X.; Wan, L.; Feng, Z.; HAO-HSIUNG LIN | Crystals | 52 | 54 | |
2020 | Lattice: An ADC/DAC-less ReRAM-based processing-in-memory architecture for accelerating deep convolution neural networks | Zheng, Q.; Wang, Z.; Feng, Z.; Yan, B.; Cai, Y.; Huang, R.; Chen, Y.; Yang, C.-L.; Li, H.H.; CHIA-LIN YANG | Proceedings - Design Automation Conference |