公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2015 | TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for Cell-internal Defects | A.F. Lin; Kuan-Yu Liao; Kuan-Ying Chiang; James Chien-Mo Li; CHIEN-MO LI | IEEE VLSI/DAT | 5 | 0 | |
2013 | Test Generation of Path Delay Faults Induced by Defects in Power TSV | Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI | IEEE Asian Test Symposium | 2 | 0 | |
2013 | Testing Leakage Faults of Power TSV in 3D IC | Chi-Jih Shih; Shih-An Hsieh; Yi-Chang Lu; James Chien-Mo Li; Tzong-Lin Wu; K. Chakrabarty; CHIEN-MO LI | IEEE Int’l workshop on 3D IC | |||
2009 | Transition Fault Diagnosis Using At-speed Test Patterns | Shang-Feng Chao; Jheng-Yang Ciou; James Chien-Mo Li; CHIEN-MO LI | IEEE Int’l Workshop on RTL and High Level Testing |