公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
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2010 | Unveiling the core technology structure for companies through patent information | Wu, H.-C.; Chen, H.-Y.; Lee, K.-Y.; Wu, Hsiao-Chun; Chen, Hung-Yi; Lee, Kung-Yen; KUNG-YEN LEE | Technological Forecasting and Social Change | |||
2012 | XRD characterization for Al- and N-doped 3C-SiC on Si (100) substrate after pulsed excimer laser anneal | Lee, K.-Y.; Huang, Y.-H.; Huang, C.-F.; Chung, C.Y.; Lin, S.C.; KUNG-YEN LEE | Materials Science Forum | 1 | 0 |