公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2000 | Room-temperature electroluminescence from electron-hole plasmas in the metal-oxide-silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Chen, M.-J.; Lin, I.C.; Lin, C.-F.; CHING-FUH LIN | Applied Physics Letters | | | |
2000 | Room-temperature electroluminescence from electron-hole plasmas in the metal-oxide-silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Chen, M.-J.; Lin, I.C.; Lin, C.-F.; CHEE-WEE LIU | Applied Physics Letters | | | |
2000 | Room-temperature electroluminescence from electron-hole plasmas in the metal-oxide-silicon tunneling diodes | Liu, C.W.; Lee, M.H.; Chen, M.-J.; Lin, I.C.; Lin, C.-F.; MIIN-JANG CHEN | Applied Physics Letters | 93 | 89 | |
2002 | Roughness- Enhanced Reliability of MOS Tunneling Diodes | Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W.; Liu, C.W. | IEEE Electron Device Letters | | | |
2002 | Roughness-enhanced reliability of MOS tunneling diodes | Lin, C.-H.; Yuan, F.; Shie, C.-R.; Chen, K.-F.; Hsu, B.-C.; Lee, M.H.; Pai, W.W. ; CHEE-WEE LIU | IEEE Electron Device Letters | 6 | 7 | |
1998 | RTP temperature measurements using Si grating prepared by laser ablation for large diameter wafer applications | Liu, C.W.; Lee, M.H.; Chao, C.Y.; Chen, C.Y.; Yang, C.C.; Chang, Y.; CHEE-WEE LIU | Materials Research Society Symposium | | | |
2005 | A simple approach toward quantitative phase field simulation for dilute-alloy solidification | Shih, C.J.; Lee, M.H.; CHUNG-WEN LAN | Journal of Crystal Growth | 11 | 10 | |
2015 | Steep Slope and Near Non-Hysteresis of FETs with Antiferroelectric-Like HfZrO for Low-Power Electronics | Lee, M.H.; Wei, Y.-T.; Chu, K.-Y.; Huang, J.-J.; Chen, C.-W.; Cheng, C.-C.; Chen, M.-J.; Lee, H.-Y.; Chen, Y.-S.; Lee, L.-H.; Tsai, M.-J.; MIIN-JANG CHEN | IEEE Electron Device Letters | 133 | 129 | |
2018 | Steep switch-off of In <inf>0.18</inf> Al <inf>0.82</inf> N/AlN/GaN on Si MIS-HEMT | Chen, P.-G.; Chou, Y.-C.; Gu, S.-S.; Hong, R.-C.; Wang, Z.-Y.; Chen, S.-Y.; Liao, C.-Y.; Tang, M.,; Liao, M.-H. ; Lee, M.H. | 2018 7th International Symposium on Next-Generation Electronics | 0 | 0 | |
2003 | Strain-induced growth of SiO<inf>2</inf> dots by liquid phase deposition | Liu, C.W.; Hsu, B.-C.; Chen, K.-F.; Lee, M.H.; Shie, C.-R.; Chen, P.-S.; CHEE-WEE LIU | Applied Physics Letters | 2 | 1 | |
2005 | Strained CMOS technology with Ge | Chen, P.S.; Lee, M.H.; Lee, S.W.; Liu, C.W.; Tsai, M.-J.; CHEE-WEE LIU | Proceedings of Electrochemical Society | | | |
2001 | Synthesis and Characterization of Sb-Doped SnO<inf>2</inf> Xerogel Electrochemical Capacitor | Wu, N.L.; Hwang, J.Y.; Liu, P.Y.; Han, C.Y.; Kuo, S.L.; Liao, K.H.; Lee, M.H.; Wang, S.Y.; NAE-LIH WU | Journal of the Electrochemical Society | 29 | 32 | |
2006 | The interface properties of SiO<inf>2</inf>/strained-si with carbon incorporation surface channel MOSFETs | Lee, M.H.; Chang, S.T.; Maikap, S.; Yu, C.-Y.; Liu, C.W.; CHEE-WEE LIU | Third International SiGe Technology and Device Meeting, ISTDM 2006 | | | |
2006 | Thermal stability study of Si cap/ultrathin Ge/Si and strained Si/Si <inf>1-x</inf>Ge<inf>x</inf>/Si nMOSFETs with HfO<inf>2</inf> gate dielectric | Yeo, C.C.; Cho, B.J.; Lee, M.H.; Liu, C.W.; Choi, K.J.; Lee, T.W.; CHEE-WEE LIU | Semiconductor Science and Technology | 1 | 1 | |
2005 | Threading Dislocation Induced Low Frequency Noise in Strained-Si nMOSFETs | Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; Liu, C.W. | IEEE Electron Device Letters | | | |
2005 | Threading dislocation induced low frequency noise in strained-Si nMOSFETs | Hua, W.-C.; Lee, M.H.; Chen, P.S.; Tsai, M.-J.; Liu, C.W.; CHEE-WEE LIU | IEEE Electron Device Letters | 34 | 31 | |
2005 | Ultra-high-vacuum chemical vapor deposition of hetero-epitaxial Si <inf>1-x-y</inf> Ge <inf>x</inf> C <inf>y</inf> thin films on Si(0 0 1) with ethylene (C <inf>2</inf> H <inf>4</inf> ) precursor as carbon source | Chen, P.S.; Lee, S.W.; Liu, Y.H.; Lee, M.H.; Tsai, M.-J.; Liu, C.W.; CHEE-WEE LIU | Materials Science in Semiconductor Processing | 8 | 12 | |