公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1989 | Advanced Imaging and Analysis Techniques with a Scanning Ion Microprobe | 王玉麟; Chabala, J. M.; Levi-Setti, R.; Wang, Yuh-Lin | Microbeam Analysis | | | |
1989 | Advances in Processing High-Temperature Superconducting Thin Films with Lasers | 王玉麟; Venkateasan, T.; Wu, X. D.; Inam, A.; Hegde, M. S.; Chase, E. W.; Chang, C. C.; England, P.; Hwang, D. M.; Krchnavek, R.; Wachtman, J. B.; McLean, W. L.; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | Chemistry of High-Temperature Superconductors II | | | |
1986 | Analytical Applications of Focused Ion Beams | 王玉麟; Parker, N. W.; Robinson, W. D.; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Electron-Beam, X-ray and Ion-Beam Techniques for Submicrometer Lithographies IV | | | |
1991 | Analytical Imaging with a Scanning Ion Microprobe | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Girod-Hallegot, C.; Wang, Yuh-Lin | Images of Materials | | | |
1988 | Angle Defined Secondary Ion Energy Spectra from Cesium-Modified Aluminum Surfaces | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | Secondary Ion Mass Spectrometry:SIMS VI | | | |
1988 | Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin | International Fonference on Microlithography | | | |
1988 | High Resolution Ion Probe Imaging and Analysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin | EMSA-MAS Meeting, Milwaukee, WI(1988.08) | | | |
1986 | High Resolution SIMS Imaging Microanalysis of Soft Biological Tissue | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Chandra, S.; Morrison G. H.; Wang, Yuh-Lin | Proceedings of 11th International Congress on Electron Microscopy | | | |
1989 | High Resolution SIMS Imaging of Multilayer Deposited High-Tc Thin Films | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Chang, R. P. R.; Hansley, D. L.; Ketterson, J. B.; Li, D. Q.; Wang, X. K.; Wang, Yuh-Lin | Secondary Ion Mass Spectrometry:SIMS VII | | | |
1986 | High Resolution Structural Information Revealed by Scanning Ion Microprobe Imaging | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | Proceedings of 11th International Congress on Electron Microscopy | | | |
1984 | High Spatial Resolution SIMS with the UC-HRL Scanning Ion Microprobe | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | The 31st International Field Emission Symposium | | | |
1985 | High-Resolution Topographic and Isotopic Imaging with a 40 KeV Ga+ Scanning Ion Microprobe | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | EMSA-MAS Meeting, Louisville, KY(1985.08) | | | |
1987 | Imaging SIMS at 20 nm Lateral Resolution:Exploratory Research Applications | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Secondary Ion Mass Spectrometry:SIMS V | | | |
1984 | Initial Operation of a New High-Resolution Scanning Ion Microsprobe | 王玉麟; Levi-Setti, R.; La Marche, P. H.; Lam, K.; Wang, Yuh-Lin | Electron-Beam, X-ray and Ion-bean Techniques for Submicrometer Lithographies III | | | |
1985 | Progress in High Resolution Scanning Ion Microscopy and SIMS Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Scanning Electron Microscopy | | | |
1986 | A Proposal for a High Resolution Scanning Ion Microprobe Based on Laser Non-Resonant Post-Ionization of Sputtered Atoms | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | SEM/86 | | | |
1988 | Scanning Ion Microscopy Images | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | Proceedings of 45th Annual Meeting of the Electron Microscopy Society of America | | | |
1985 | Scanning Ion Microscopy:Elemental Maps at High Lateral Resolution | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Conference on Analytical Chemistry and Applied Spectroscopy | | | |
1983 | Secondary Ion Imaging in the Scanning Ion Microscope | Levi-Setti, R.; La Marche, P. H.; Lam, K.; Shields, T. H.; 王玉麟; Wang, Yuh-Lin | The 6th International Conference on ION Beam Analysis | | | |
1989 | Secondary Ion Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin | The 47th Annual Meeting of the Electron Microscopy Society of America | | | |