公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1985 | Progress in High Resolution Scanning Ion Microscopy and SIMS Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Scanning Electron Microscopy | | | |
1986 | A Proposal for a High Resolution Scanning Ion Microprobe Based on Laser Non-Resonant Post-Ionization of Sputtered Atoms | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | SEM/86 | | | |
1988 | Scanning Ion Microscopy Images | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Wang, Yuh-Lin | Proceedings of 45th Annual Meeting of the Electron Microscopy Society of America | | | |
1985 | Scanning Ion Microscopy:Elemental Maps at High Lateral Resolution | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Conference on Analytical Chemistry and Applied Spectroscopy | | | |
1983 | Secondary Ion Imaging in the Scanning Ion Microscope | Levi-Setti, R.; La Marche, P. H.; Lam, K.; Shields, T. H.; 王玉麟; Wang, Yuh-Lin | The 6th International Conference on ION Beam Analysis | | | |
1989 | Secondary Ion Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin | The 47th Annual Meeting of the Electron Microscopy Society of America | | | |
1989 | The Use of Focused Heavy-Ion Beams for Submicrometer Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin | Microbeam Analysis | | | |