公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2015 | Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits | Y.-N. Chen; C.-J. Chen; M.-L. Fan; Pin Su; C.-T. Chuang; VITA PI-HO HU | Journal of Low Power Electronics and Applications | 9 | 0 | |
2012 | Independently-Controlled-Gate FinFET Schmitt Trigger Sub-Threshold SRAMs | C.-Y. Hsieh; M.-L. Fan; VITA PI-HO HU | IEEE Transactions on Very Large Scale Integration (VLSI) Systems | 40 | 29 | |
2015 | Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FET | C.-W. Hsu; M.-L. Fan; V. P.-H. Hu; Pin Su; VITA PI-HO HU ; C.-W. Hsu; M.-L. Fan; V. P.-H. Hu; Pin Su; 胡璧合 | IEEE Journal of the Electron Devices Society | 20 | 0 | |
2015 | Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; C.-W. Hsu; Pin Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; C.-W. Hsu; Pin Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Electron Devices | 24 | 20 | |
2014 | Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits | M.-L. Fan; S.-Y. Yang; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | Microelectronics Reliability | 23 | 22 | |
2014 | Stability and Performance Optimization of Heterochannel Monolithic 3-D SRAM Cells Considering Interlayer Coupling | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Electron Devices | 8 | 6 | |
2009 | Static Noise Margin of Ultrathin-Body SOI Subthreshold SRAM Cells—An Assessment Based on Analytical Solutions of Poisson's Equation | Y.-S. Wu; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Electron Devices | 7 | 5 | |
2013 | Threshold Voltage Design and Performance Assessment of Hetero-Channel SRAM Cells | V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU ; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Electron Devices | 7 | 6 | |
2013 | Threshold Voltage Design of UTB SOI SRAM With Improved Stability/Variability for Ultralow Voltage Near Subthreshold Operation | V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; VITA PI-HO HU ; V. P.-H. Hu; M.-L. Fan; P. Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Nanotechnology | 7 | 5 | |
2012 | Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications | M.-L. Fan; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Circuits and Systems II: Express Briefs | 17 | 12 |