公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2010 | A novel method for measuring thick film thermal conductivity | Sun W.-C.; Huang M.-J. ; Chien H.-C.; Chang T.-Y.; Yao D.-J. | 2010 IEEE 5th International Conference on Nano/Micro Engineered and Molecular Systems | 2 | 0 | |
2010 | The thickness difference method for measuring the thermal conductivity of thick films | Huang M.-J. ; Chang T.-Y.; Chien H.-C.; Sun W.-C.; Yao D.-J. | Journal of Microelectromechanical Systems | 0 | 0 |