公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2019 | Fabrication of omega-gated negative capacitance finfets and SRAM | Sung, P.-J.; Su, C.-J.; Lu, D.D.; Luo, S.-X.; Kao, K.-H.; Ciou, J.-Y.; Jao, C.-Y.; Hsu, H.-S.; Wang, C.-J.; Hong, T.-C.; Liao, T.-H.; Fang, C.-C.; Wang, Y.-S.; Huang, H.-F.; Li, J.-H.; Huang, Y.-C.; Hsueh, F.-K.; Wu, C.-T.; Ma, W.C.-Y.; Huang, K.-P.; Lee, Y.-J.; Chao, T.-S.; Li, J.-Y.; Wu, W.-F.; Yeh, W.-K.; Wang, Y.-H.; JIUN-YUN LI | 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019 | 3 | 0 | |
2005 | Failure modes and reliability analysis of belt-type CVT systems for scooters | Wu, W.-F.; Liu, T.; TYNG LIU ; Wu W.-F. | SAE Technical Papers | 1 | 0 | |
2019 | First Demonstration of CMOS Inverter and 6T-SRAM Based on GAA CFETs Structure for 3D-IC Applications | Chang, S.-W.; Li, J.-H.; Huang, M.-K.; Huang, Y.-C.; Huang, S.-T.; Wang, H.-C.; Huang, Y.-J.; Wang, J.-Y.; Yu, L.-W.; Huang, Y.-F.; Hsueh, F.-K.; Sung, P.-J.; Wu, C.-T.; Ma, W.C.-Y.; Kao, K.-H.; Lee, Y.-J.; Lin, C.-L.; Chuang, R.W.; Huang, K.-P.; Samukawa, S.; Li, Y.; Lee, W.-H.; Chu, T.-Y.; Chao, T.-S.; Huang, G.-W.; Wu, W.-F.; JIUN-YUN LI ; Shieh, J.-M.; Yeh, W.-K.; Wang, Y.-H.; Lu, D.D.; Wang, C.-J.; Lin, N.-C.; Su, C.-J.; Lo, S.-H.; Huang, H.-F. | Technical Digest - International Electron Devices Meeting, IEDM | 41 | 0 | |
2017 | High performance complementary Ge peaking FinFETs by room temperature neutral beam oxidation for sub-7 nm technology node applications | Lee, Y.-J.; Hong, T.-C.; Hsueh, F.-K.; Sung, P.-J.; Chen, C.-Y.; Chuang, S.-S.; Cho, T.-C.; Noda, S.; Tsou, Y.-C.; Kao, K.-H.; Wu, C.-T.; Yu, T.-Y.; Jian, Y.-L.; Su, C.-J.; Huang, Y.-M.; Huang, W.-H.; Chen, B.-Y.; Chen, M.-C.; Huang, K.-P.; Li, J.-Y.; Chen, M.-J.; Li, Y.; Samukawa, S.; Wu, W.-F.; Huang, G.-W.; Shieh, J.-M.; Tseng, T.-Y.; Chao, T.-S.; Wang, Y.-H.; MIIN-JANG CHEN ; JIUN-YUN LI | Technical Digest - International Electron Devices Meeting, IEDM | 8 | 0 | |
1994 | Probabilistic analysis of fatigue crack propagation under random loading | Wu, W.-F.; Shin, C.S.; Shen, J.-J.; CHOW-SHING SHIN | Journal of Pressure Vessel Technology | | | |
2005 | Quantitative reliability analysis of electronic packages in consideration of variability of model parameters | Wu, W.-F.; Lin, Y.-Y.; Young, H.-T.; HONG-TSU YOUNG | 7th Electronics Packaging Technology Conference | | | |
2007 | Reinforcing porous silica with carbon nanotubes to enhance mechanical performance | Luo, J.-T.; Wen, H.-C.; Chou, C.-P. ; Wu, W.-F.; Wan, B.-Z. | Journal of Composite Materials | 11 | 11 | |
2007 | The roles of hydrophobic group on the surface of ultra low dielectric constant porous silica film during thermal treatment | Luo, J.-T.; Wu, W.-F.; Wen, H.-C.; Wan, B.-Z.; Chang, Y.-M.; Chou, C.-P. ; Chen, J.-M.; Chen, W.-N. | Thin Solid Films | 22 | 20 | |
2006 | Study of Fatigue Damage Accumulation and Fatigue Reliability based on Rotating Bending Test Data | Wu, W.-F.; Yang, C.-H.; Fu, T.-T. | SAE World Congress | | | |
2003 | Template Effects on Low k Materials Made from Spin-on Mesoporous Silica | Ting, C.-Y.; Ouyan, D.-F.; Wu, W.-F.; Wan, B.-Z. | Studies in Surface Science and Catalysis 146: | | | |
2014 | Tunable L-band fiber lasers using fiber bragg gratings and wavelength reflector | Liaw, S.-K.; Wu, W.-F.; CHOW-SHING SHIN | Microwave and Optical Technology Letters | | | |
2019 | Voltage Transfer Characteristic Matching by Different Nanosheet Layer Numbers of Vertically Stacked Junctionless CMOS Inverter for SoP/3D-ICs applications | Sung, P.-J.; Chang, C.-Y.; Chen, L.-Y.; Kao, K.-H.; Su, C.-J.; Liao, T.-H.; Fang, C.-C.; Wang, C.-J.; Hong, T.-C.; Jao, C.-Y.; Hsu, H.-S.; Luo, S.-X.; Wang, Y.-S.; Huang, H.-F.; Li, J.-H.; Huang, Y.-C.; Hsueh, F.-K.; Wu, C.-T.; Huang, Y.-M.; Hou, F.-J.; Luo, G.-L.; Huang, Y.-C.; Shen, Y.-L.; Ma, W.C.-Y.; Huang, K.-P.; Lin, K.-L.; Samukawa, S.; Li, Y.; Huang, G.-W.; Lee, Y.-J.; Li, J.-Y.; Wu, W.-F.; Shieh, J.-M.; Chao, T.-S.; Yeh, W.-K.; Wang, Y.-H.; JIUN-YUN LI | Technical Digest - International Electron Devices Meeting, IEDM | 9 | 0 | |