| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2015 | Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits | Y.-N. Chen; C.-J. Chen; M.-L. Fan; Pin Su; C.-T. Chuang; VITA PI-HO HU | Journal of Low Power Electronics and Applications | 9 | 0 | |
| 2015 | Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; C.-W. Hsu; Pin Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; C.-W. Hsu; Pin Su; C.-T. Chuang; 胡璧合 ; VITA PI-HO HU | IEEE Transactions on Electron Devices | 24 | 20 | |
| 2014 | Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits | M.-L. Fan; S.-Y. Yang; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | Microelectronics Reliability | 22 | 22 | |
| 2014 | Stability and Performance Optimization of Heterochannel Monolithic 3-D SRAM Cells Considering Interlayer Coupling | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; 胡璧合 ; VITA PI-HO HU | IEEE Transactions on Electron Devices | 8 | 6 | |
| 2012 | Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications | M.-L. Fan; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Circuits and Systems II: Express Briefs | 16 | 12 |
