| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2014 | Single-trap-induced random telegraph noise for FinFET, Si/Ge Nanowire FET, Tunnel FET, SRAM and logic circuits | M.-L. Fan; S.-Y. Yang; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | Microelectronics Reliability | 23 | 22 | |
| 2014 | Stability and Performance Optimization of Heterochannel Monolithic 3-D SRAM Cells Considering Interlayer Coupling | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; P. Su; C.-T. Chuang; 胡璧合 ; VITA PI-HO HU | IEEE Transactions on Electron Devices | 8 | 6 | |
| 2012 | Variability Analysis of Sense Amplifier for FinFET Subthreshold SRAM Applications | M.-L. Fan; Y.-N. Chen; P. Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Circuits and Systems II: Express Briefs | 16 | 12 |
