公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2020 | A Variation-Resilient Microprocessor with a Two-Level Timing Error Detection and Correction System in 28-nm CMOS | Hong, C.-Y.; Liu, T.-T.; TSUNG-TE LIU | IEEE Journal of Solid-State Circuits | 10 | 10 | |
2020 | A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm | Liang, Z.-Y.; Wei, H.-H.; Liu, T.-T.; TSUNG-TE LIU | IEEE Journal of Solid-State Circuits | 15 | 13 |