公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2009 | A novel ontology-based knowledge engineering approach for yield symptom identification in semiconductor manufacturing | Su, F.-H.; Chang, S.-C.; Fan, C.-M.; Tsai, Y.-J.; Jheng, J.; Kao, C.-P.; Lu, C.-Y.; SHI-CHUNG CHANG | 2009 IEEE International Conference on Automation Science and Engineering | 0 | 0 | |
2009 | An efficient Si light-emitting diode based on an n- ZnO/SiO<inf>2</inf>-Si nanocrystals-SiO<inf>2</inf>/p-Si heterostructure | Sun, E.; Su, F.-H.; Shih, Y.-T.; Tsai, H.-L.; Chen, C.-H.; Wu, M.-K.; Yang, J.-R.; JER-REN YANG ; MIIN-JANG CHEN | Nanotechnology | 15 | 17 | |
2008 | Knowledge engineering of analysis tool application processes for yield symptom identification | Su, F.-H.; Chang, S.-C.; Tsai, Y.-J.; Lu, C.-Y.; Fan, C.-M.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | | | |
2007 | Service oriented platform design for collaborative engineering data analysis | Lee, J.-R.; Chang, S.-C.; Su, F.-H.; Fan, C.-M.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 | |