公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2008 | Knowledge engineering of analysis tool application processes for yield symptom identification | Su, F.-H.; Chang, S.-C.; Tsai, Y.-J.; Lu, C.-Y.; Fan, C.-M.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | |||
2007 | Service oriented platform design for collaborative engineering data analysis | Lee, J.-R.; Chang, S.-C.; Su, F.-H.; Fan, C.-M.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | 2 | 0 |