公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2004 | Electromigration-induced microstructure evolution in tin studied by synchrotron x-ray microdiffraction | Wu A.T.; Tu K.N.; Lloyd J.R.; Tamura N.; Valek B.C.; C. ROBERT KAO | Applied Physics Letters | |||
2005 | Synchrotron X-ray micro-diffraction analysis on microstructure evolution in Sn under electromigratton | Wu A.T.; Tamura N.; Lloyd J.R.; Kao C.R.; Tu K.N.; C. ROBERT KAO | Materials Research Society Symposium |