Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2007 | Determination of three-dimensional interfacial strain - A novel method of probing interface structure with X-ray Bragg-surface diffraction | Sun, W.-C.; Chu, C.-H.; Chang, H.-C.; Wu, B.-K.; Chen, Y.-R.; Cheng, C.-W.; Chiu, M.-S.; Shen, Y.-C.; Wu, H.-H.; Hung, Y.-S.; Chang, S.-L.; Hong, M.-H.; Tang, M.-T.; Stetsko, Yu.P.; MINGHWEI HONG | Thin Solid Films | 4 | 2 |