公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1986 | Analytical Applications of Focused Ion Beams | 王玉麟; Parker, N. W.; Robinson, W. D.; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Electron-Beam, X-ray and Ion-Beam Techniques for Submicrometer Lithographies IV | | | |
1984 | High Spatial Resolution SIMS with the UC-HRL Scanning Ion Microprobe | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | The 31st International Field Emission Symposium | | | |
1985 | High-Resolution Topographic and Isotopic Imaging with a 40 KeV Ga+ Scanning Ion Microprobe | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | EMSA-MAS Meeting, Louisville, KY(1985.08) | | | |
1987 | Imaging SIMS at 20 nm Lateral Resolution:Exploratory Research Applications | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Secondary Ion Mass Spectrometry:SIMS V | | | |
1985 | Progress in High Resolution Scanning Ion Microscopy and SIMS Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Scanning Electron Microscopy | | | |
1985 | Scanning Ion Microscopy:Elemental Maps at High Lateral Resolution | 王玉麟; Levi-Setti, R.; Crow, G.; Wang, Yuh-Lin | Conference on Analytical Chemistry and Applied Spectroscopy | | | |