公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1997 | Charge transfer process in Tl2Ba2Ca2Cu3O10 and Tl2Ba2CaCu2O8 thin films probed by polarized X-ray absorption spectroscopy | Chen, J. M.; Liu, R. G.; Liu, R. S.; Lin, H. C.; Uen, T. M.; Juang, J. Y.; Gou, Y. S.; RU-SHI LIU | Chemical Physics Letters | 3 | 3 | |
1996 | Effects of oxygen content on the penetration depth in YBCO thin films | Hsieh, M. C.; Tseng, T. Y.; CHAO-MING FU ; Wu, K. H.; Juang, J. Y.; Uen, T. M.; Gou, Y. S. | Czechoslovak Journal of Physics | 0 | 0 | |
1998 | Polarized X-ray absorption studies in double-thallium-layer superconducting | Chen, J. M.; Liu, R. G.; Liu, R. S.; Lin, H. C.; Uen, T. M.; Juang, J. Y.; Gou, Y. S.; RU-SHI LIU | Chinese Journal of Physics | | 0 | |
1998 | Preparation and electronic properties of YBa2Cu3Ox films with controlled oxygen stoichiometries | Wu, K. H.; Hsieh, M. C.; Chen, S. P.; Chao, S. C.; Juang, J. Y.; Uen, T. M.; Gou, Y. S.; Tseng, T. Y.; CHAO-MING FU ; Chen, J. M.; Liu, R. G. | Japanese Journal of Applied Physics Part 1-Regular Papers Brief Communications & Review Papers | 27 | 30 | |