公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2000 | Age-based double EWMA controller and its application to a CMP process | Chen, A.; Guo, R.-S.; ARGON CHEN | Run-to-Run Control in Semiconductor Manufacturing | | | |
2001 | Age-based double EWMA controller and its application to CMP processes | Chen, Argon; Guo, R.-S. | IEEE Transactions on Semiconductor Manufacturing | | | |
2001 | Data mining and fault diagnosis based on wafer acceptance test data and in-line manufacturing data | Fan, C.-M.; Guo, R.-S.; Chen, A.; Hsu, K.-C.; ARGON CHEN ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference, Proceedings | 12 | 0 | |
2006 | A quadratic goal programming model and sensitivity analysis for semiconductor supply chain | Chiang, D.; Guo, R.-S.; Chen, A.; ARGON CHEN ; MING-HUANG CHIANG ; RUEY-SHAN GUO | IEEE International Symposium on Semiconductor Manufacturing Conference Proceedings | 0 | 0 | |
2000 | Realizing dynamic manufacturing service provisioning mechanism in order commitment service | Chang, S.-C.; Guo, R.-S.; Su, Y.-H.; Lai, Y.-C.; SHI-CHUNG CHANG | IEEE International Symposium on Semiconductor Manufacturing Conference | | | |