公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2000 | An effective SPC approach to monitoring semiconductor manufacturing processes with multiple variation sources | Chen, Argon ; Guo, R.S.; Yeh, P.J. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
2000 | Real-time equipment health evaluation and dynamic preventive maintenance | Chen, Argon ; Guo, R.S.; Wu, G.S. | The Ninth International Symposium on Semiconductor Manufacturing, 2000 | 0 | 0 | |
1998 | A real-time equipment monitoring and fault detection system | Guo, R.S.; Chen, A.; Tseng, C.L.; Fong, I.K.; Yang, A.; Lee, C.L.; Wu, C.H.; Lin, S. ; Huang, S.J.; Lee, Y.C.; Chang, S.G.; RUEY-SHAN GUO ; ARGON CHEN | Semiconductor Manufacturing Technology Workshop | 8 | 0 | |
2000 | Survey of the properties of BGO crystals for the Extreme Forward Calorimeter at BELLE | Akhmetshin, R.; Wang, M.Z.; Guo, R.S.; Huang, H.C.; Lu, R.S.; Tsai, K.L.; Ueno, K.; Wang, C.H.; Chou, F.I.; Wei, Y.Y.; RONG-SHYANG LU ; WEI-SHU HOU | Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment | 17 | 15 | |