公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1991 | Analytical Imaging with a Scanning Ion Microprobe | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Girod-Hallegot, C.; Wang, Yuh-Lin | Images of Materials | | | |
1988 | Chemical Characterization of Electronic Microstructures with Sub-100 nm Lateral Resolution | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin | International Fonference on Microlithography | | | |
1988 | High Resolution Ion Probe Imaging and Analysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Hallegot, P.; Wang, Yuh-Lin | EMSA-MAS Meeting, Milwaukee, WI(1988.08) | | | |
1989 | Secondary Ion Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin | The 47th Annual Meeting of the Electron Microscopy Society of America | | | |
1989 | The Use of Focused Heavy-Ion Beams for Submicrometer Imaging Microanalysis | 王玉麟; Levi-Setti, R.; Chabala, J. M.; Girod, C.; Hallegot, P.; Wang, Yuh-Lin | Microbeam Analysis | | | |