2017 | Editorial. | Chakrabarty, Krishnendu; Alioto, Massimo; Baas, Bevan M.; Boon, Chirn Chye; Chang, Meng-Fan; Chang, Naehyuck; Chang, Yao-Wen; Chang, Chip-Hong; Chang, Shih-Chieh; Chen, Poki; Chowdhury, Masud H.; Corsonello, Pasquale; Elfadel, Ibrahim Abe M.; Hamdioui, Said; Hashimoto, Masanori; Ho, Tsung-Yi; Homayoun, Houman; Hwang, Yuh-Shyan; Joshi, Rajiv V.; Karnik, Tanay; Kermani, Mehran Mozaffari; Kim, Chulwoo; Kim, Tae-Hyoung; Kulkarni, Jaydeep P.; Kursun, Eren; Larsson, Erik; Li, Hai (Helen); Li, Huawei; Mercier, Patrick P.; Mishra, Prabhat; Nagata, Makoto; Natarajan, Arun S.; Nii, Koji; Pande, Partha Pratim; Savidis, Ioannis; Seok, Mingoo; Tan, Sheldon X.-D.; Tehranipoor, Mark Mohammad; Todri-Sanial, Aida; Velev, Miroslav N.; Wen, Xiaoqing; Xu, Jiang; Zhang, Wei; Zhang, Zhengya; Jackson, Stacey Weber; YAO-WEN CHANG | IEEE Trans. VLSI Syst. | 0 | 0 | |