公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2013 | Automatic test pattern generation for delay defects using timed characteristic functions. | Ho, Shin-Yann; Lin, Shuo-Ren; Yuan, Ko-Lung; Kuo, Chien-Yen; Liao, Kuan-Yu; Jiang, Jie-Hong R.; CHIEN-MO LI ; JIE-HONG JIANG | The IEEE/ACM International Conference on Computer-Aided Design, ICCAD'13, San Jose, CA, USA, November 18-21, 2013 | 2 | 0 | |
2014 | 應用時間特徵函式之針對延遲缺陷自動測資產生方法 | 何欣諺; Ho, Shin-Yann |