| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2006 | A comparative study of high resolution transmission electron microscopy, atomic force microscopy and infrared spectroscopy for GaN thin films grown on sapphire by metalorganic chemical vapor deposition | Feng, Zhe Chuan; Li, Kun; Hou, Yun Tian; Zhao, Jie; Lu, W.; Collins, W.E. | Surface and Coatings Technology |  |
