公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2013 | Compact Test Pattern Selection for Small Delay Defect | CHIEN-MO LI ; J. Y. Chang; K. Y. Liao; S. C. Hsu; J. C. M. Li; J. C. Rau; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | 18 | ||
2004 | ELF-Murphy Data on Defects and Test Sets | CHIEN-MO LI ; E. J. McCluskey; A. Alyamani; J. C. M. Li; C. W. Tseng; E. Volkerink; F. F. Feriani; E. Li; S. Mitra; CHIEN-MO LI | IEEE VLSI Test Symposium | |||
2014 | Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects | E. H. Ma; W. E. Wei; H. Y. Li; J. C. M. Li; I. C. Cheng; Y. H. Yeh; I-CHUN CHENG ; CHIEN-MO LI | IEEE Journal of Display Technology | 3 | 3 | |
2012 | Launch-on-Shift Test Generation for Testing Scan Designs Containing Synchronous and Asynchronous Clock Domains, | CHIEN-MO LI ; JIUN-LANG HUANG ; S. Wu; L. T. Wang; X. Wen; W. B. Jone; M. S. Hsiao; F. Li; J. C. M. Li; J. L. Huang; CHIEN-MO LI ; JIUN-LANG HUANG | ACM Transactions on Design Automation of Electronic Systems (TODAES) | 0 | ||
2014 | Physical-aware Systematic Multiple Defect Diagnosis | CHIEN-MO LI ; P. J. Chen; C. C. Che; J. C. M. Li; S. F. Kuo; P. Y. Hsueh; C. Y. Kuo; J. N. Lee; CHIEN-MO LI | IET Proceedings Computers and Digital Techniques | 10 | ||
2012 | Systematic Open Via Diagnosis Based on Physical Features | CHIEN-MO LI ; P. J. Chen; C. C. Che; J. C. M. Li; K. Y. Tsai; S. F. Kuo; P. Y. Hsueh; Y. Y. Chen; J. N. Lee; CHIEN-MO LI | IEEE Silicon Debug and Diagnosis Workshop | |||
2013 | Test Clock Domain Optimization to Avoid Scan Shift Failures due to Flip-flop Simultaneous Triggering | CHIEN-MO LI ; Y. C. Huang; M. H. Tsai; W. S. Ding; J. C. M. Li; M. T. Chang; M. H. Tsai; C. M. Tseng; H. C. Li; CHIEN-MO LI | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems | |||
2012 | Testing of TSV-induced Small Delay Faults for Three Dimensional Integrated Circuits, | CHIEN-MO LI ; C.Y. Kuo; C. J. Shih; J. C. M. Li; K. Chakrabarty; CHIEN-MO LI | IEEE 3D IC Test workshop | |||
2012 | Thermal-aware Test Schedule and TAM Co-Optimization for Three Dimensional IC | CHIEN-MO LI ; C. J. Shih; C. Y. Hsu; C. Y. Kou; J. C. M. Li; J. C. Rau; K. Chakrabarty; CHIEN-MO LI | Active and Passive Electronic Components |