| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2010 | 100 GHz Ga2O3/GaN single nanowire metal-oxide-semiconductor transistor | J.-W. Yu; Y.-R. Wu; J.-J. Huang; L.-H. Peng; LUNG-HAN PENG | 2010 IEEE International Electron Devices Meeting (IEDM) | |||
| 2010 | 75GHz Ga2O3/GaN single nanowire metal-oxide-semiconductor transisto | J.-W. Yu; Y.-R. Wu; J.-J. Huang; L.-H. Peng; JIAN-JANG HUANG ; LUNG-HAN PENG | 32nd IEEE Compound Semiconductor IC symposium | |||
| 2006 | A low-cost jitter measurement technique for BIST applications | J.-L. Huang; J.-J. Huang; Y.-S. Liu; Huang, Jiun-Lang | Journal of Electronic Testing: Theory and Appications | |||
| 2010 | Effects of gate-bias stress on ZnO thin-film transistors | L.-Y. Su; H.-Y. Lin; S.-L. Wang; Y.-H. Yeh; C.-C. Cheng; L.-H. Peng; J.-J. Huang; JIAN-JANG HUANG ; LUNG-HAN PENG | Journal of the Society for Information Display | |||
| 2005 | Focus Control Method for Delta-Sigma Based Image Formation Device | P.-C. Li; J.-J. Huang; S.-E. Chen; Y.-L. Kao; T.I. Chu; PAI-CHI LI | ||||
| 2003 | Method for dynamic focus control | J.-J. Huang; P.-C. Li; PAI-CHI LI | ||||
| 2008 | Testing LCD Source Driver IC with Built-On-Scribe-Line Test Circuitry | J.-J. Huang; J.-L. Huang; JIUN-LANG HUANG | Asian Test Symposium |
