| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2017 | Atomic-Scale Structural and Chemical Characterization of Hexagonal Boron Nitride Layers Synthesized at the Wafer-Scale with Monolayer Thickness Control | Lin, W.-H.; Brar, V.W.; Jariwala, D.; Sherrott, M.C.; Tseng, W.-S.; Wu, C.-I.; Yeh, N.-C.; Atwater, H.A.; CHIH-I WU | Chemistry of Materials | 29 | 29 |
