公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1987 | Annealing and Radiation Effects on Al/Ta205/Si02/Si Capacitors | 胡振國 ; Jeng, M. J.; Hwu, Jenn-Gwo | | | | |
1993 | Aspect Ratio Design Consideration for Radiation-Hard CMOS Inverters | 胡振國 ; Jeng, M. J.; Hwu, Jenn-Gwo | | | | |
1995 | Aspect Ratio Effect on the Radiation Hardness of CMOS Inverters | 胡振國 ; Jeng, M. J.; Hwu, Jenn-Gwo | | | | |
1987 | Clockwise C-V Hysteresis Phenomena of Metal-Tantalum Oxide-Silicon-Oxide-Silicon(P) Capacitors Due to Leakage Current Through Tantalum Oxide | 胡振國 ; Jeng, M. J.; 王維新; Tu, Y. K.; Hwu, Jenn-Gwo ; Wang, Way-Seen | Journal of Applied Physics | | | |
1986 | Radiation Effects on the Oxide Properties of Silicon MOS Capacitor | 胡振國 ; Lee, G. S.; Jeng, M. J.; 王維新; 李嗣涔 ; Hwu, Jenn-Gwo ; Wang, Way-Seen; Lee, Si-Chen | Electronic Devices and Materials Symposium | | | |
1994 | Rapid Thermal Post-Metallization Annealing Effect on the Reliability of Thin Gate Oxides | 胡振國 ; Jeng, M. J.; Lin, H. S. | | 1 | 1 | |