公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2010 | A scalable quantitative measure of IR-drop for scan pattern generation | M.-F. Wu; K.-H. Tsai; W.-T. Cheng; H.-C. Pan; J.-L. Huang; A. Kifli; JIUN-LANG HUANG | International Conference on Computer-Aided Design | 4 | 0 | |
2015 | A Test-Application-Count Based Learning Technique for Test Time Reduction | G.-Y. Lin; K.-H. Tsai; J.-L. Huang; W.-T. Cheng; JIUN-LANG HUANG | International Symposium on VLSI Design, Automation, and Test | 3 | 0 | |
2010 | An Improved Weight Assignment Scheme for IR-Drop-Aware At-Speed Scan Pattern Generation | M.-F. Wu; H.-C. Pan; T.-H. Wang; J.-L. Huang; K.-H. Tsai; W.-T. Cheng; JIUN-LANG HUANG | Asia and South Pacific Design Automation Conference | |||
2013 | Improve speed path identification with suspect path expressions | J.-L. Huang; K.-H. Tsai; Y.-P. Liu; R. Guo; M. Sharma; W.-T. Cheng; JIUN-LANG HUANG | International Symposium on VLSI Design, Automation, and Test | 0 | 0 |