| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2013 | Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions | Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li; JIE-HONG JIANG | IEEE/ACM International Conference on Computer-Aided Design (ICCAD) | |||
| 2015 | TARGET: Timing-AwaRe Gate Exhaustive Transition ATPG for Cell-internal Defects | A.F. Lin; Kuan-Yu Liao; Kuan-Ying Chiang; James Chien-Mo Li; CHIEN-MO LI | IEEE VLSI/DAT | 4 | 0 |
