公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1998 | Analysis of pattern-dependent and timing-dependent failures in an experimental test chip. | CHIEN-MO LI ; Chang, Jonathan T.-Y.; Tseng, Chao-Wen; Li, Chien-Mo James; Purtell, Mike; McCluskey, Edward J.; CHIEN-MO LI | Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998 | | | |
2005 | Diagnosis of Resistive-Open and Stuck-Open
Defects in Digital CMOS ICs | Li, Chien-Mo James; McCluskey, Edward J. | IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS & SYSTEMS 24(11) | | | |
2000 | Testing for tunneling opens. | CHIEN-MO LI ; Li, Chien-Mo James; McCluskey, Edward J.; CHIEN-MO LI | Proceedings IEEE International Test Conference 2000, Atlantic City, NJ, USA, October 2000 | | | |
2009 | 可撓式薄膜電晶體數位電路靜態時序分析 | 許肇軒; Hsu, Chao-Hsuan | | | | |