| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2011 | An accurate timing-aware diagnosis algorithm for multiple small delay defects | Chen P.-J.; WEI-LI HSU ; Li J.C.-M.; Tseng N.-H.; Chen K.-Y.; Changchien W.-P.; Liu C.C.C. | Proceedings of the Asian Test Symposium | 6 | 0 | |
| 2020 | Diagnosis technique for Clustered Multiple Transition Delay Faults | You Y.-S; Liu C.-Y; Wu M.-T; Chen P.-W; Li J.C.-M.; CHIEN-MO LI | Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 | 3 | 0 | |
| 2020 | High Efficiency and Low Overkill Testing for Probabilistic Circuits | Lee M.-T; Wu C.-H; Liu S.-T; Hsieh C.-Y; Li J.C.-M.; CHIEN-MO LI | Proceedings - 2020 IEEE International Test Conference in Asia, ITC-Asia 2020 | 1 | 0 |
