公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2022 | Local-Oxide-Thinning-Induced Deep Depletion Phenomenon in MOS Capacitors | Lin K.-W; JENN-GWO HWU | ECS Journal of Solid State Science and Technology | 1 | 1 | |
2021 | Role of Schottky barrier height modulation on the reverse bias current behavior of MIS(P) tunnel diodes | Chen K.-C; Lin K.-W; JENN-GWO HWU | IEEE Access | 2 | 2 |