| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
| 1994 | Effect of Fluorine on the Radiation Hardness of Gate Oxides Prepared by Liquid Phase Deposition Following Rapid Thermal Oxidation | 胡振國 ; Lu, W. S.; Hwu, Jenn-Gwo ; Lu, W. S. | | | | |
| 1993 | Improvement in Radiation Hardness of Rapid Thermal Nitrided Oxides by Repeated Irradiation-Then-Anneal Treatments | 胡振國 ; Lu, W. S.; Hwu, Jenn-Gwo ; Lu, W. S. | | | | |
| 1994 | Radiation Hardness on Fluorinated Oxides Prepared by Liquid Phase Deposition Method Following Rapid Thermal Annealing Treatment | Lu, W. S.; 胡振國 ; Chou, J. S.; 李嗣涔 ; Hwu, Jenn-Gwo ; Lee, Si-Chen | 1994 International EDMS | | | |
| 1992 | Radiation Pardness of Rapid Thermal Reoxidized Nitrided Gate Oxides | 胡振國 ; Lu, W. S.; Hwu, Jenn-Gwo | | | | |
| 2000 | Ribbed Package Geometry for Reducing Thermal Warpage and Wire Sweep during PBGA Encapsulation | Yang, S. Y.; Jiang, S. C.; Lu, W. S.; YangSY | IEEE Transactions on Components and Packaging Technologies | | |  |
