公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2009 | A Low Communication Overhead and Load Balanced Parallel ATPG with Improved Static Fault Partition Method | K.-W. Yeh; M.-F. Wu; J.-L. Huang; JIUN-LANG HUANG | International Conference on Algorithms and Architectures for Parallel Processing | 10 | 0 | |
2010 | A scalable quantitative measure of IR-drop for scan pattern generation | M.-F. Wu; K.-H. Tsai; W.-T. Cheng; H.-C. Pan; J.-L. Huang; A. Kifli; JIUN-LANG HUANG | International Conference on Computer-Aided Design | 4 | 0 | |
2007 | An Efficient Peak Power Reduction Technique for Scan Testing | M.-F. Wu; K.-S. Hu; J.-L. Huang; JIUN-LANG HUANG | Asian Test Symposium | 18 | 0 | |
2010 | An Improved Weight Assignment Scheme for IR-Drop-Aware At-Speed Scan Pattern Generation | M.-F. Wu; H.-C. Pan; T.-H. Wang; J.-L. Huang; K.-H. Tsai; W.-T. Cheng; JIUN-LANG HUANG | Asia and South Pacific Design Automation Conference | |||
2013 | Evaluation of 18F-Labeled Targeted Perfluorocarbon-Filled Albumin microbubbles as a probe for microUS and microPET in tumor-bearing mice | A.-H. Liao; S.-Y. Wu; H.-E. Wang; C.-H. Weng; M.-F. Wu; PAI-CHI LI | Ultrasonics | |||
2009 | LPTest: A Flexible Low-Power Test Pattern Generator | M.-F. Wu; K.-S. Hu; J.-L. Huang; JIUN-LANG HUANG | Journal of Electronic Testing: Theory and Applications | 7 | 5 | |
2008 | PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Testing in Huffman Coding Test Compression Environment | Y.-T. Lin; M.-F. Wu; J.-L. Huang; JIUN-LANG HUANG | Asian Test Symposium | 3 | 0 | |
2009 | Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment | M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG | IEEE Transactions on Compuuter-Aided Design | 16 | 9 | |
2010 | Power supply noise reduction in broadcast-based compression environment for at-speed scan testing | C.-Y. Liang; M.-F. Wu; J.-L. Huang; JIUN-LANG HUANG | Asian Test Symposium | 4 | 0 | |
2008 | Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Testing | M.-F. Wu; J.-L. Huang; X. Wen; K. Miyase; JIUN-LANG HUANG | International Test Conference | 48 | 0 |