公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2004 | IC HTOL Test Stress Condition Optimization | Peng, Brian; Chen, Ing-Yi; Kuo, Sy-Yen; Bolger, Colin; SY-YEN KUO | 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’04) | 14 | 0 | |
2004 | IC HTOL Test Stress Condition Optimization. | Peng, Brian; Chen, Ing-Yi; Kuo, Sy-Yen; Bolger, Colin; SY-YEN KUO | 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings | 0 | 0 |