Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
---|---|---|---|---|---|---|
2016 | Evaluation of Monolayer and Bilayer 2-D Transition Metal Dichalcogenide Devices for SRAM Applications | C.-H. Yu; M.-L. Fan; K.-C. Yu; Pin Su; C.-T. Chuang; VITA PI-HO HU | IEEE Transactions on Electron Devices | 16 | 17 | |
2014 | Evaluation of Stabilit, Performance of Ultra-Low Voltage MOSFET, TFET, and Mixed TFET-MOSFET SRAM Cell With Write-Assist Circuits | Y.-N. Chen; M.-L. Fan; V. P.-H. Hu; Pin Su; C.-T. Chuang; VITA PI-HO HU ; Y.-N. Chen; M.-L. Fan; V. P.-H. Hu; Pin Su; C.-T. Chuang; 胡璧合 | IEEE Journal on Emerging and Selected Topics in Circuits and Systems | 46 | 38 | |
2014 | Evaluation of Sub-0.2 V High-Speed Low-Power Circuits Using Hetero-Channel MOSFET and Tunneling FET Devices | Y.-N. Chen; M.-L. Fan; V. P.-H. Hu; Pin Su; C.-T. Chuang; VITA PI-HO HU ; Y.-N. Chen; M.-L. Fan; V. P.-H. Hu; Pin Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Circuits and Systems I: Regular Papers | 13 | 9 | |
2015 | Impacts of Work Function Variation and Line-Edge Roughness on TFET and FinFET Devices and 32-Bit CLA Circuits | Y.-N. Chen; C.-J. Chen; M.-L. Fan; Pin Su; C.-T. Chuang; VITA PI-HO HU | Journal of Low Power Electronics and Applications | 9 | 0 | |
2015 | Investigation and Simulation of Work-Function Variation for III-V Broken-Gap Heterojunction Tunnel FET | C.-W. Hsu; M.-L. Fan; V. P.-H. Hu; Pin Su; VITA PI-HO HU ; C.-W. Hsu; M.-L. Fan; V. P.-H. Hu; Pin Su; 胡璧合 | IEEE Journal of the Electron Devices Society | 20 | 0 | |
2015 | Investigation of Backgate-Biasing Effect for Ultrathin-Body III-V Heterojunction Tunnel FET | M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; C.-W. Hsu; Pin Su; C.-T. Chuang; VITA PI-HO HU ; M.-L. Fan; V. P.-H. Hu; Y.-N. Chen; C.-W. Hsu; Pin Su; C.-T. Chuang; 胡璧合 | IEEE Transactions on Electron Devices | 24 | 20 |