2007 | Capacitance-voltage characteristics of BiFeO3/SrTiO3/GaN heteroepitaxial structures | Yang, SY; Zhan, Q; Yang, PL; Cruz, MP; Chu, YH; Ramesh, R; Wu, YR; Singh, J; Tian, W; Schlom, DG; YUH-RENN WU | Applied Physics Letters | 55 | 46 | |
2006 | Structure, Composition and Order at Interfaces of Crystalline Oxides and Other High $κ$ Materials on Si | Gustafsson, T; Garfunkel, E; Goncharova, L; Starodub, D; Barnes, R; Dalponte, M; Bersuker, G; Foran, B; Lysaght, P; Schlom, DG; others; MINGHWEI HONG | Defects in High-k Gate Dielectric Stacks: Nano-Electronic Semiconductor Devices, Springer Verlag | | | |