Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2008 | Unravelling the free electron behavior in InN | Darakchieva, V.; Hofmann, T.; Schubert, M.; Sernelius, B.E.; Giuliani, F.; Xie, M.-Y.; Persson, P.O.Å.; Monemar, B.; Schaff, W.J.; Hsiao, C.-L.; Chen, L.-C. ; Nanishi, Y. | Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD | 0 | 0 |