公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
---|---|---|---|---|---|---|
2013 | Automatic Test Pattern Generation for Delay Defects Using Timed Characteristic Functions | Shin-Yann Ho; Shuo-Ren Lin; Ko-Lung Yuan; Chien-Yen Kuo; Kuan-Yu Liao; Jie-Hong R. Jiang; Chien-Mo James Li; JIE-HONG JIANG | IEEE/ACM International Conference on Computer-Aided Design (ICCAD) |