Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
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2014 | Flexible TFT Circuit Analyzer Considering Process Variation, Aging, and Bending Effects | E. H. Ma; W. E. Wei; H. Y. Li; J. C. M. Li; I. C. Cheng; Y. H. Yeh; I-CHUN CHENG ; CHIEN-MO LI | IEEE Journal of Display Technology | 3 | 3 |