2003 | Integrated yield-mining solution with enhanced electrical test data correlation | Fan, Chih-Min; Guo, Ruey-Shan ; Chen, Argon ; Hon, Amos; Wei, John; King, Mingchu | The Ninth International Symposium on Semiconductor Manufacturing, 2003 | 0 | 0 | |
1999 | SHEWMAC: an end-of-line SPC scheme for joint monitoring of process mean and variance | Fan, Chih-Min; SHI-CHUNG CHANG ; RUEY-SHAN GUO ; Kung, Hui-Hung; You, Jyh-Cheng; Chen, Hsin-Pai; Lin, Steven; Wei, John | Semiconductor Manufacturing Conference Proceedings, 1999 IEEE International Symposium on | 2 | 0 | |