| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
| 1995 | Characterization of a second MetR-binding site in the metE metR regulatory region of Salmonella typhimurium | Wu, W.-F.; Urbanowski, M.L.; Stauffer, G.V.; WHEI-FEN WU | Journal of Bacteriology | 13 | 13 | |
| 2008 | Comparison of combustion models in cleanroom fire | Huang, Y.-L.; Shiu, H.-R.; Chang, S.-H.; Wu, W.-F.; SIH-LI CHEN ; Wu W.-F. | Journal of Mechanics | 9 | 10 | |
| 2014 | Cyclic loading test and numerical analysis of flanged joint and reducer of RHR piping systems | Lai, Z.-Y.; Liu, Y.-F.; Yu, C.-C.; Chai, J.-F.; Lin, F.-R.; Wu, W.-F.; Huang, Y.-N.; Shen, M.-Y.; YIN-NAN HUANG | American Society of Mechanical Engineers, Pressure Vessels and Piping Division | 0 | 0 | |
| 2020 | Detecting removed attributes in the cyber system for smart manufacturing | Yen, C.-T.; Tsung, C.-K.; WEN-FANG WU ; Wu W.-F. | Journal of Supercomputing | 2 | 1 | |
| 2019 | Fabrication of omega-gated negative capacitance finfets and SRAM | Sung, P.-J.; Su, C.-J.; Lu, D.D.; Luo, S.-X.; Kao, K.-H.; Ciou, J.-Y.; Jao, C.-Y.; Hsu, H.-S.; Wang, C.-J.; Hong, T.-C.; Liao, T.-H.; Fang, C.-C.; Wang, Y.-S.; Huang, H.-F.; Li, J.-H.; Huang, Y.-C.; Hsueh, F.-K.; Wu, C.-T.; Ma, W.C.-Y.; Huang, K.-P.; Lee, Y.-J.; Chao, T.-S.; Li, J.-Y.; Wu, W.-F.; Yeh, W.-K.; Wang, Y.-H.; JIUN-YUN LI | 2019 International Symposium on VLSI Technology, Systems and Application, VLSI-TSA 2019 | 3 | 0 | |
| 2005 | Failure modes and reliability analysis of belt-type CVT systems for scooters | Wu, W.-F.; Liu, T.; Wu, C.-H.; TYNG LIU | SAE Technical Papers | 1 | 0 | |
| 2005 | Failure modes and reliability analysis of belt-type CVT systems for scooters | Wu, W.-F.; Liu, T.; TYNG LIU ; Wu W.-F. | SAE Technical Papers | 1 | 0 | |
| 2019 | First Demonstration of CMOS Inverter and 6T-SRAM Based on GAA CFETs Structure for 3D-IC Applications | Chang, S.-W.; Li, J.-H.; Huang, M.-K.; Huang, Y.-C.; Huang, S.-T.; Wang, H.-C.; Huang, Y.-J.; Wang, J.-Y.; Yu, L.-W.; Huang, Y.-F.; Hsueh, F.-K.; Sung, P.-J.; Wu, C.-T.; Ma, W.C.-Y.; Kao, K.-H.; Lee, Y.-J.; Lin, C.-L.; Chuang, R.W.; Huang, K.-P.; Samukawa, S.; Li, Y.; Lee, W.-H.; Chu, T.-Y.; Chao, T.-S.; Huang, G.-W.; Wu, W.-F.; Li, J.-Y.; Shieh, J.-M.; Yeh, W.-K.; Wang, Y.-H.; Lu, D.D.; Wang, C.-J.; Lin, N.-C.; Su, C.-J.; Lo, S.-H.; Huang, H.-F.; JIUN-YUN LI | Technical Digest - International Electron Devices Meeting, IEDM | 28 | 0 | |
| 2012 | Genome-Wide PhoB Binding and Gene Expression Profiles Reveal the Hierarchical Gene Regulatory Network of Phosphate Starvation in Escherichia coli | Yang, C.; Huang, T.-W.; Wen, S.-Y.; Chang, C.-Y.; Tsai, S.-F.; Wu, W.-F.; Chang, C.-H.; WHEI-FEN WU | PLoS ONE | 34 | 26 | |
| 2019 | Half-metallic property induced by double exchange interaction in the double perovskite Bi<inf>2</inf>BB'O<inf>6</inf> (B, B0 = 3d transitional metal) via first-principles calculations | Lin, H.-Z.; Hu, C.-Y.; Lee, P.-H.; Yan, A.Z.-Z.; Wu, W.-F.; Chen, Y.-F.; Wang, Y.-K.; YANG-FANG CHEN | Materials | 10 | 10 | |
| 2017 | High performance complementary Ge peaking FinFETs by room temperature neutral beam oxidation for sub-7 nm technology node applications | Lee, Y.-J.; Hong, T.-C.; Hsueh, F.-K.; Sung, P.-J.; Chen, C.-Y.; Chuang, S.-S.; Cho, T.-C.; Noda, S.; Tsou, Y.-C.; Kao, K.-H.; Wu, C.-T.; Yu, T.-Y.; Jian, Y.-L.; Su, C.-J.; Huang, Y.-M.; Huang, W.-H.; Chen, B.-Y.; Chen, M.-C.; Huang, K.-P.; Li, J.-Y.; Chen, M.-J.; Li, Y.; Samukawa, S.; Wu, W.-F.; Huang, G.-W.; Shieh, J.-M.; Tseng, T.-Y.; Chao, T.-S.; Wang, Y.-H.; MIIN-JANG CHEN ; JIUN-YUN LI | Technical Digest - International Electron Devices Meeting, IEDM | 7 | 0 | |
| 2017 | High performance complementary Ge peaking FinFETs by room temperature neutral beam oxidation for sub-7 nm technology node applications | Lee, Y.-J.; Hong, T.-C.; Hsueh, F.-K.; Sung, P.-J.; Chen, C.-Y.; Chuang, S.-S.; Cho, T.-C.; Noda, S.; Tsou, Y.-C.; Kao, K.-H.; Wu, C.-T.; Yu, T.-Y.; Jian, Y.-L.; Su, C.-J.; Huang, Y.-M.; Huang, W.-H.; Chen, B.-Y.; Chen, M.-C.; Huang, K.-P.; Li, J.-Y.; Chen, M.-J.; Li, Y.; Samukawa, S.; Wu, W.-F.; Huang, G.-W.; Shieh, J.-M.; Tseng, T.-Y.; Chao, T.-S.; Wang, Y.-H.; Yeh, W.-K.; JIUN-YUN LI | Technical Digest - International Electron Devices Meeting, IEDM | 7 | 0 | |
| 1993 | MetJ-mediated regulation of the Salmonella typhimurium metE and metR genes occurs through a common operator region | Wu, W.-F.; Urbanowski, M.L.; Stauffer, G.V.; WHEI-FEN WU | FEMS Microbiology Letters | 9 | 0 | |
| 1994 | Probabilistic analysis of fatigue crack propagation under random loading | Wu, W.-F.; Shin, C.S.; Shen, J.-J.; CHOW-SHING SHIN | Journal of Pressure Vessel Technology | | | |
| 2005 | Quantitative reliability analysis of electronic packages in consideration of variability of model parameters | Wu, W.-F.; Lin, Y.-Y.; Young, H.-T.; HONG-TSU YOUNG | 7th Electronics Packaging Technology Conference | | | |
| 2007 | Reinforcing porous silica with carbon nanotubes to enhance mechanical performance | Luo, J.-T.; Wen, H.-C.; Chou, C.-P. ; Wu, W.-F.; Wan, B.-Z. | Journal of Composite Materials | 11 | 10 | |
| 2007 | The roles of hydrophobic group on the surface of ultra low dielectric constant porous silica film during thermal treatment | Luo, J.-T.; Wu, W.-F.; Wen, H.-C.; Wan, B.-Z.; Chang, Y.-M.; Chou, C.-P. ; Chen, J.-M.; Chen, W.-N. | Thin Solid Films | 22 | 20 | |
| 1996 | Six-fold rotational symmetry of ClpQ, the E. coli homolog of the 20S proteasome, and its ATP-dependent activator, ClpY | Kessel, M.; Wu, W.-F.; Gottesman, S.; Kocsis, E.; Steven, A.C.; Maurizi, M.R.; WHEI-FEN WU | FEBS Letters | 103 | 93 | |
| 2011 | Stepwise Activity of ClpY (HslU) mutants in the processive degradation of Escherichia coli ClpYQ (HslUV) protease substrates | Hsieh, F.-C.; Chen, C.-T.; Weng, Y.-T.; Peng, S.-S.; Chen, Y.-C.; Huang, L.-Y.; Hu, H.-T.; Wu, Y.-L.; Lin, N.-C.; Wu, W.-F.; Hsieh, Fan-Ching; WHEI-FEN WU ; NAI-CHUN LIN ; Chen, Chien-Teh; Weng, Yu-Ting; Peng, Sheng-Shiang; Chen, Yu-Chun; Huang, Ling-Yi; Hu, Hui-Ting; Wu, Yew-Long; Lin, Nai-Chun ; Wu, Whei-Fen | Journal of Bacteriology | 9 | 8 | |
| 2006 | Study of Fatigue Damage Accumulation and Fatigue Reliability based on Rotating Bending Test Data | Wu, W.-F.; Yang, C.-H.; Fu, T.-T. | SAE World Congress | | | |
