公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
1993 | An Automated W-Band On-Wafer Noise Figure Measurement System | Chen, S.; Yang, D.C.; Wang, H.; Hayashibara, K.; Godshalk, E.M.; Allen, B.; HUEI WANG | 41st ARFTG Conference Digest - Spring 1993 | 9 | 0 | |
1992 | A Configurable Integrated Test Methodology for Monolithic Microwave Integrated Circuit Production | Wang, H.; Yang, D.C.; Esfandiari, R.; Joseph, T.; Ellis, R.K.; Ng, G.; HUEI WANG | IEEE Transactions on Semiconductor Manufacturing | 1 | 1 | |
1996 | Versatile W-band on-wafer MMIC test set | Lin, E.W.; Huang, T.W.; Lo, D.C.W.; Wang, H.; Yang, D.C.; Dow, G.S.; HUEI WANG ; TIAN-WEI HUANG | 47th ARFTG Conference Digest - Spring 1996: High Power RF/Microwave Device Measurements, ARFTG 1996 | 2 | 0 | |