公開日期 | 標題 | 作者 | 來源出版物 | scopus | WOS | 全文 |
2018 | Automatic equipment fault fingerprint extraction for the fault diagnostic on the batch process data | Rostami, H.; Blue, J.; Yugma, C.; JAKEY BLUE | Applied Soft Computing Journal | | | |
2019 | The detection and the control of machine/chamber mismatching in semiconductormanufacturing | Chouichi, A.; Blue, J.; Yugma, C.; Pasqualini, F.; JAKEY BLUE | Winter Simulation Conference | | | |
2017 | Equipment condition diagnosis and fault fingerprint extraction in semiconductor manufacturing | Rostami, H.; Blue, J.; Yugma, C.; JAKEY BLUE | 2016 15th IEEE International Conference on Machine Learning and Applications | | | |
2018 | Heterogranular multivariate analytics for detecting and controlling the root causes of the mismatching machines in semiconductor manufacturing | Chouichi, A.; Blue, J.; Yugma, C.; Pasqualini, F.; JAKEY BLUE | 2018 29th Annual SEMI Advanced Semiconductor Manufacturing Conference | | | |
2014 | Integration of scheduling and advanced process control in semiconductor manufacturing: Review and outlook | Yugma, C.; Blue, J.; Dauzere-P?r?s, S.; Vialletelle, P.; JAKEY BLUE | IEEE International Conference on Automation Science and Engineering | | | |
2015 | Integration of scheduling and advanced process control in semiconductor manufacturing: review and outlook | Yugma, C.; Blue, J.; Dauz?re-P?r?s, S.; Obeid, A.; JAKEY BLUE | Journal of Scheduling | | | |
2019 | Parallel machine scheduling with time constraints on machine qualifications | Nattaf, M.; Dauz?re-P?r?s, S.; Yugma, C.; Wu, C.-H.; CHENG-HUNG WU | Computers and Operations Research | | | |