| Issue Date | Title | Author(s) | Source | scopus | WOS | Fulltext/Archive link |
|---|---|---|---|---|---|---|
| 2006 | A comparative study of high resolution transmission electron microscopy, atomic force microscopy and infrared spectroscopy for GaN thin films grown on sapphire by metalorganic chemical vapor deposition | Feng, Zhe Chuan; Li, Kun; Hou, Yun Tian; Zhao, Jie; Lu, W.; Collins, W.E. | Surface and Coatings Technology |  | ||
| 2006 | Infrared Reflectance Study of 3C-SiC Grown on Si by Chemical Vapor Deposition | Feng, Zhe Chuan; Huang, C.W.; Chang, W.Y.; Zhao, Jie; Tin, Chin Che; Lu, Wei Jie; Collins, W.E. | Materials Science Forum |  |
